A novel pattern matching-based fault diagnosis using canonical variate analysis for industrial process

Yuan Xu, Cuihuan Fan, Qunxiong Zhu, Yanlin He, Qi Hu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Original data with high dimension and noise are usually directly applied to pattern matching, which will affect the accuracy of models to some extent. To solve this issue, a novel pattern matching method integrating canonical variable analysis with adaptive rank-order morphological f lter (CVA-AROMF) is proposed for fault diagnosis in this article. First, canonical variable analysis (CVA) is used to extract the features of training data with sequence correlation and process dynamics, and then the features are used as the template signal of adaptive rank-order morphological f lter (AROMF). Second, the noise-bearing test signal is used to match the template morphology waveform under the supervision of different fault template signals. Third, the fault mode is classifieds by finding the minimal distance between the filter output signal and the raw test signal of each fault mode. Simulations based on Tennessee Eastman(TE) process data is performed and the result verifies the accuracy and superiority of this proposed method.

Original languageEnglish
Title of host publicationProceedings of 2019 IEEE 8th Data Driven Control and Learning Systems Conference, DDCLS 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1132-1136
Number of pages5
ISBN (Electronic)9781728114545
DOIs
Publication statusPublished - May 2019
Externally publishedYes
Event8th IEEE Data Driven Control and Learning Systems Conference, DDCLS 2019 - Dali, China
Duration: 24 May 201927 May 2019

Publication series

NameProceedings of 2019 IEEE 8th Data Driven Control and Learning Systems Conference, DDCLS 2019

Conference

Conference8th IEEE Data Driven Control and Learning Systems Conference, DDCLS 2019
Country/TerritoryChina
CityDali
Period24/05/1927/05/19

Keywords

  • Adaptive rank-order morphological filter
  • Canonical variate analysis
  • Fault diagnosis
  • Pattern matching
  • Te process

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