TY - GEN
T1 - How Long Can RIS Work Effectively
T2 - 98th IEEE Vehicular Technology Conference, VTC 2023-Fall
AU - Wang, Ke
AU - Lam, Chan Tong
AU - Ng, Benjamin K.
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - In this paper, from an electronic reliability perspective, non-residual stochastic hardware aging (HA) effects are introduced to reconfigurable intelligent surfaces (RISs) aided communication systems, for characterizing the life cycle of the RIS. Different from traditional residual impairment factors such as RIS phase imperfections and transceiver noises, the impact of the stochastic HA effect on the RIS is related to RIS runtimes and lifetimes. Given this background, we first propose a Rician channel model for the RIS-aided system with the stochastic HA effect. Then, the definition for the lifetime of the RIS is mathematically given as the time at which 63.2% of the elements expire. Besides, closed-form achievable rate expression is also derived. Analytical and simulated results unveil an important insight that throughout the life cycle of the RIS, the residual impairment dominates when the runtime is shorter than the lifetime, otherwise the stochastic HA effect should be paid more attention to. This work can be regarded as the first guideline for evaluating and predicting the whole life cycle performance of the RIS-assisted system.
AB - In this paper, from an electronic reliability perspective, non-residual stochastic hardware aging (HA) effects are introduced to reconfigurable intelligent surfaces (RISs) aided communication systems, for characterizing the life cycle of the RIS. Different from traditional residual impairment factors such as RIS phase imperfections and transceiver noises, the impact of the stochastic HA effect on the RIS is related to RIS runtimes and lifetimes. Given this background, we first propose a Rician channel model for the RIS-aided system with the stochastic HA effect. Then, the definition for the lifetime of the RIS is mathematically given as the time at which 63.2% of the elements expire. Besides, closed-form achievable rate expression is also derived. Analytical and simulated results unveil an important insight that throughout the life cycle of the RIS, the residual impairment dominates when the runtime is shorter than the lifetime, otherwise the stochastic HA effect should be paid more attention to. This work can be regarded as the first guideline for evaluating and predicting the whole life cycle performance of the RIS-assisted system.
KW - Reconfigurable intelligent surface
KW - achievable rate
KW - electronic reliability
KW - impairment factor
KW - stochastic hardware aging effect
UR - http://www.scopus.com/inward/record.url?scp=85181171661&partnerID=8YFLogxK
U2 - 10.1109/VTC2023-Fall60731.2023.10333489
DO - 10.1109/VTC2023-Fall60731.2023.10333489
M3 - Conference contribution
AN - SCOPUS:85181171661
T3 - IEEE Vehicular Technology Conference
BT - 2023 IEEE 98th Vehicular Technology Conference, VTC 2023-Fall - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 10 October 2023 through 13 October 2023
ER -