Research and Application of a Novel RPCA-SVME based Multiple Faults Recognition

Yuan Xu, Kaiduo Cong, Yang Zhang, Qunxiong Zhu, Yan Lin He

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

In the modern industrial process, the likelihood of the occurrence of multiple faults is higher than that of a single fault Comparing with single faults, the multi-faults problem has higher coupling and complexity, thus it is quite important to establish an effective multi-faults recognition model to ensure process safety. In this paper, a multi-fault recognition model based on reconstructed principal component analysis (RPCA) algorithm and support vector machine ensemble (SVME) classifier is proposed to satisfy the needs. First, obtain the principal component information from the original high-dimensional data space. Second, to solve the loss of local feature information, reconstruct the local structural error of the feature space through the inverse mapping matrix, and then align the error to obtain the reconstructed coordinates. Third, based on the One vs. One (OvO) ensemble strategy, an SVME classifier is constructed for multiple faults recognition. Finally, to verify the performance of the proposed RPCA-SVME model, the simulation experiments are made on a Circle dataset and the Tennessee Eastman process (TEP). The comparison results show that the proposed method can guarantee higher diagnostic accuracy and macro F1 score.

Original languageEnglish
Title of host publicationProceedings of 2021 IEEE 10th Data Driven Control and Learning Systems Conference, DDCLS 2021
EditorsMingxuan Sun, Huaguang Zhang
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages484-488
Number of pages5
ISBN (Electronic)9781665424233
DOIs
Publication statusPublished - 14 May 2021
Externally publishedYes
Event10th IEEE Data Driven Control and Learning Systems Conference, DDCLS 2021 - Suzhou, China
Duration: 14 May 202116 May 2021

Publication series

NameProceedings of 2021 IEEE 10th Data Driven Control and Learning Systems Conference, DDCLS 2021

Conference

Conference10th IEEE Data Driven Control and Learning Systems Conference, DDCLS 2021
Country/TerritoryChina
CitySuzhou
Period14/05/2116/05/21

Keywords

  • Multiple Faults Recognition
  • One vs. One (OvO) ensemble strategy
  • Principal Component Analysis (PCA)
  • Space Reconstruction
  • Tennessee Eastman Process (TEP)

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