Research on Dual Extreme Learning Machine Based on Residual Structure and its application to process modeling

Qun Xiong Zhu, Ye Tian, Yuan Xu, Yan Lin He

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In order to deal with the high dimensional and high complex process data, a residual structure based dual extreme learning machine model (R-DELM) is proposed. This method proposed in this paper uses dual ELM model: one ELM model is used to establish the process model, which can be viewed as a primary regression model; another one is used to compensate the first ELM model by establish residual-ELM model, which can be viewed as a secondary regression model. In the proposed method, the Kendall correlation coefficient (KCC) is firstly utilized to select the relevant process variables for soft sensor modeling, then the proposed R-DELM model is utilized to compute the key quality output. A real-world production process called Purified Terephthalic Acid (PTA) is applied to investigate the model performance of the R-DELM based soft sensor model. Compared with some other machine learning models, simulation results indicate that R-DELM has the characteristic of high modeling accuracy.

Original languageEnglish
Title of host publicationProceedings - 2022 Chinese Automation Congress, CAC 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3784-3788
Number of pages5
ISBN (Electronic)9781665465335
DOIs
Publication statusPublished - 2022
Externally publishedYes
Event2022 Chinese Automation Congress, CAC 2022 - Xiamen, China
Duration: 25 Nov 202227 Nov 2022

Publication series

NameProceedings - 2022 Chinese Automation Congress, CAC 2022
Volume2022-January

Conference

Conference2022 Chinese Automation Congress, CAC 2022
Country/TerritoryChina
CityXiamen
Period25/11/2227/11/22

Keywords

  • Dual Extreme Learning Machine
  • Process modeling
  • PTA industrial process

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