Abstract
In actual chemical processes, the fact that some essential variables cannot be directly measured makes the production quality out-of-control and even results in large economic losses. In this study, a novel sample clustering extreme learning machine (SC-ELM) modeLis developed to achieve timely and accurate measurement. SC-ELM is a fast training algorithm with an excellent generalization performance, and the combined sample clustering approach solves the non-optimaLinput weights of ELM. The network structure is designed by a fast leave-one-out cross-validation (FLOO-CV) method. Meanwhile, the validity of SC-ELM modeLis firstly tested by two classical regression datasets. With the comparison of other ELM models, SC-ELM is proved to be an effective modeLin both modeling accuracy and network structure. Then, SC-ELM is applied in measuring the quality index of a high-density polyethylene (HDPE) process running in a chemical plant, and the experiment results demonstrate that SC-ELM model can achieve quality estimation with higher measuring accuracy and less training time.
Original language | English |
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Pages (from-to) | 801-806 |
Number of pages | 6 |
Journal | IFAC-PapersOnLine |
Volume | 28 |
Issue number | 8 |
DOIs | |
Publication status | Published - 1 Jul 2015 |
Externally published | Yes |
Event | 9th IFAC Symposium on Advanced Control of Chemical Processes, ADCHEM 2015 - Whistler, Canada Duration: 7 Jun 2015 → 10 Jun 2015 |
Keywords
- Density based K-means clustering algorithm
- Extreme learning machine
- Fast leave-one-out cross-validation method
- High-density polyethylene process
- Soft-sensing