跳至主導覽 跳至搜尋 跳過主要內容

EM-Net: A Deep Learning Model Using Enhanced Attention and Multi-Scale Feature Fusion for Text Image Forgery Detection

  • Shandong University of Political Science and Law
  • School of Robotics Guangdong Polytechnic of Science and Technology

研究成果: Conference contribution同行評審

摘要

In this paper, we propose an EM-Net for detecting the tiny regions of subtle features, which includes three stages. First, a Multi-scale Feature Extraction module (MSFE-module) is used to extract multi-scale and multi-layer feature information. A Feature Enhanced (FE-module) catches the key information in different scales and refines the results by assigning more weights to forgery areas. Therefore valuable features can be enhanced while irrelevant information is suppressed. As the network is constantly downsampling the image, the resolution becomes small. To restore the size, in the Feature Fusion decoder module (FFU-module), the multi-level information by integrating the global features and location details, so as to improve the performance of locating the forgery areas. To demonstrate the validity of our model, we compare the performance of the proposed EM-Net with state-of-art methods. The results show that our performance was excellent on the testing dataset.

原文English
主出版物標題Proceedings - 2025 17th International Conference on Signal Processing Systems, ICSPS 2025
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1118-1121
頁數4
ISBN(電子)9798350392784
DOIs
出版狀態Published - 2025
事件2025 17th International Conference on Signal Processing Systems, ICSPS 2025 - Chengdu, China
持續時間: 24 10月 202526 10月 2025

出版系列

名字Proceedings - 2025 17th International Conference on Signal Processing Systems, ICSPS 2025

Conference

Conference2025 17th International Conference on Signal Processing Systems, ICSPS 2025
國家/地區China
城市Chengdu
期間24/10/2526/10/25

指紋

深入研究「EM-Net: A Deep Learning Model Using Enhanced Attention and Multi-Scale Feature Fusion for Text Image Forgery Detection」主題。共同形成了獨特的指紋。

引用此