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PID control loop performance assessment and diagnosis based on DEA-related MCDA

  • Zun Wang
  • , Yongming Han
  • , Zhiqiang Geng
  • , Qunxiong Zhu
  • , Yuan Xu
  • , Yanlin He

研究成果: Conference contribution同行評審

3 引文 斯高帕斯(Scopus)

摘要

Control loop performance assessment and diagnosis have been attracting more and more attention in the academia and industry. Both traditional performance assessment method and minimum variance method often require the process model and provide limited information, which is not particularly convenient for practical applications. Therefore, the method based on data envelopment analysis (DEA)-related multiple criteria decision analysis (MCDA) is developed for assessing and diagnosing PID control loop performance, which relies solely upon the collected process data during routine plant operation. The control loop performance is assessed and sorted by utilizing the self-evaluation DEA-related MCDA model. The operation priority of the control loop is ranked and determined by utilizing the cross-evaluation DEA-related MCDA model. The improving direction and quantitative space of control loop performance can be diagnosed by DEA-related MCDA model with slack variables and non-Archimedean infinitesimal ϵ. The correctness and effectiveness of the proposed method are confirmed and validated by simulation examples.

原文English
主出版物標題2017 6th International Symposium on Advanced Control of Industrial Processes, AdCONIP 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面535-540
頁數6
ISBN(電子)9781509043972
DOIs
出版狀態Published - 18 7月 2017
對外發佈
事件6th International Symposium on Advanced Control of Industrial Processes, AdCONIP 2017 - Taipei, Taiwan, Province of China
持續時間: 28 5月 201731 5月 2017

出版系列

名字2017 6th International Symposium on Advanced Control of Industrial Processes, AdCONIP 2017

Conference

Conference6th International Symposium on Advanced Control of Industrial Processes, AdCONIP 2017
國家/地區Taiwan, Province of China
城市Taipei
期間28/05/1731/05/17

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