Research on Dual Extreme Learning Machine Based on Residual Structure and its application to process modeling

Qun Xiong Zhu, Ye Tian, Yuan Xu, Yan Lin He

研究成果: Conference contribution同行評審

摘要

In order to deal with the high dimensional and high complex process data, a residual structure based dual extreme learning machine model (R-DELM) is proposed. This method proposed in this paper uses dual ELM model: one ELM model is used to establish the process model, which can be viewed as a primary regression model; another one is used to compensate the first ELM model by establish residual-ELM model, which can be viewed as a secondary regression model. In the proposed method, the Kendall correlation coefficient (KCC) is firstly utilized to select the relevant process variables for soft sensor modeling, then the proposed R-DELM model is utilized to compute the key quality output. A real-world production process called Purified Terephthalic Acid (PTA) is applied to investigate the model performance of the R-DELM based soft sensor model. Compared with some other machine learning models, simulation results indicate that R-DELM has the characteristic of high modeling accuracy.

原文English
主出版物標題Proceedings - 2022 Chinese Automation Congress, CAC 2022
發行者Institute of Electrical and Electronics Engineers Inc.
頁面3784-3788
頁數5
ISBN(電子)9781665465335
DOIs
出版狀態Published - 2022
對外發佈
事件2022 Chinese Automation Congress, CAC 2022 - Xiamen, China
持續時間: 25 11月 202227 11月 2022

出版系列

名字Proceedings - 2022 Chinese Automation Congress, CAC 2022
2022-January

Conference

Conference2022 Chinese Automation Congress, CAC 2022
國家/地區China
城市Xiamen
期間25/11/2227/11/22

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