RMS percent of wavelet transform for the detection of stochastic high impedance faults

T. M. Lai, W. C. Lo, W. M. To, K. H. Lam

研究成果: Conference contribution同行評審

14 引文 斯高帕斯(Scopus)

摘要

High impedance faults (HIF) are faults which are difficult to detect by overcurrent protection relays. This paper presents a practical pattern recognition based algorithm for electric distribution high impedance fault detection. The scheme recognizes the distortion of the voltage and current waveforms caused by the arcs usually associated with HIF. The analysis using rms ratios of Discrete Wavelet Transform (DWT) yields three phase voltage and current in the low frequency range which are fed to a classifier for pattern recognition. The classifier is based on the algorithm using artificial neural network (ANN) approach. A HIF model was also developed, where the random nature of the arc was simulated using MATLAB.

原文English
主出版物標題Proceedings of 2012 IEEE 15th International Conference on Harmonics and Quality of Power, ICHQP 2012
頁面823-828
頁數6
DOIs
出版狀態Published - 2012
事件2012 IEEE 15th International Conference on Harmonics and Quality of Power, ICHQP 2012 - Hong Kong, Hong Kong
持續時間: 17 6月 201220 6月 2012

出版系列

名字Proceedings of International Conference on Harmonics and Quality of Power, ICHQP
ISSN(列印)1540-6008
ISSN(電子)2164-0610

Conference

Conference2012 IEEE 15th International Conference on Harmonics and Quality of Power, ICHQP 2012
國家/地區Hong Kong
城市Hong Kong
期間17/06/1220/06/12

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